• DocumentCode
    3718541
  • Title

    Grenoble Large Scale Facilities for Advanced Characterisation of Microelectronics Devices

  • Author

    J. Beaucour;J. Segura-Ruiz;B. Giroud;E. Capria;E. Mitchell;C. Curfs;J. C. Royer;M. Baylac;F. Villa;S. Rey

  • Author_Institution
    Inst. LAUE-LANGEVIN, Grenoble, France
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The French IRT-Nanoelec consortium in collaboration with GENEPI2 accelerator is offering world unique and complementary techniques for Hirel components characterisation. Part of this capability is the high and low (thermal) energy neutron testing of devices.
  • Keywords
    "Neutrons","Radiation effects","Europe","Instruments","Laboratories","Microelectronics","Synchrotrons"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365616
  • Filename
    7365616
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718541