Title :
Performance Degradation after Proton Irradiation in Charge-Coupled Devices: A Cross-Device Comparison
Author :
Thibaut Prod´homme;Peter Verhoeve;Thierry Beaufort;Sander Bloammert;Bart Butler;Ludovic Duvet;Frederic Lemmel;Hans Smit;Cornelis van der Luijt
Author_Institution :
Eur. Space Agency, Noordwijk, Netherlands
Abstract :
In the context of the technology validation of Charge-Coupled Devices for Euclid and PLATO, two European Space Agency missions dedicated to Astronomy, we present a comparison between the performance degradation (dark current and charge transfer inefficiency) after proton irradiation of two types of device manufactured by e2v.
Keywords :
"Temperature measurement","Radiation effects","Protons","Dark current","Charge coupled devices","Performance evaluation","Charge transfer"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365646
