• DocumentCode
    3718580
  • Title

    Radiation-Hardened Gate Array with Embedded SRAM

  • Author

    N. Malashevich;M. Makarceva;R. Fedorov

  • Author_Institution
    Sci.-Manuf. Complex “
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The problem of information storage reliability improvement in random access memory (RAM) devices oriented to application as part of gate arrays designed for space-related application is considered in this article.
  • Keywords
    "Logic gates","Random access memory","Arrays","Integrated circuits","Reliability","Protons","Resistance"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365656
  • Filename
    7365656
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718580