Title :
SEE Test Results of 256k RAM with Preliminary TID Irradiation
Author :
Vasily S. Anashin;Pavel A. Chubunov;Sergey A. Iakovlev
Author_Institution :
Inst. of Space Device Eng., Branch of JSC United Rocket &
Abstract :
this paper presents SEE test results of 256k RAM with preliminary γ-ray irradiation and comparison with previous not irradiated samples tests. Difference between irradiated and not irradiated samples test results for SEL is shown.
Keywords :
"Integrated circuits","Radiation effects","Silicon","Random access memory","Single event upsets","Testing"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365662
