Title :
The Technique for Estimation of the Chip Temperature of Integrated Circuits during Irradiation
Author :
Vladislav A. Felitsyn;Alexander S. Bakerenkov;Viacheslav S. Pershenkov;Alexander S. Rodin;Vladimir V. Belyakov;Vladimir V. Shurenkov;Nikita S. Glukhov
Author_Institution :
Nat. Res. Nucl. Univ. MEPhI (Moscow Eng. Phys. Inst.), Moscow, Russia
Abstract :
The technique for estimation of the chip temperature of integrated circuits during irradiation is described. The technique is based on the experimental determination of the actual value of junction-to-ambient thermal resistance.
Keywords :
"Temperature measurement","Integrated circuits","Thermal resistance","Radiation effects","Temperature dependence","Semiconductor device measurement"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365682
