• DocumentCode
    3721053
  • Title

    Using SiC MOSFETs to improve reliability of EV inverters

  • Author

    Hao Zheng;Xubin Wang;Xuemei Wang;Li Ran;Bo Zhang

  • Author_Institution
    School of Electric Power, South China University of Technology, Guangzhou, 510640, P.R China
  • fYear
    2015
  • Firstpage
    359
  • Lastpage
    364
  • Abstract
    Wide bandgap semiconductor devices like SiC have achieved more and more attentions in electric vehicles-(EVs) because of their high-temperature capability, high-power density, and high efficiency. As all known, EVs frequently operate in acceleration, deceleration and low speed driving in urban traffic. Thus, not only the rated operation condition should be considered, but also some extreme operation conditions. In order to study the variations of junction temperature of SiC-based MOSFETs comparing with Si-based IGBT of EVs inverter at different operation condition, an electro-thermal coupling model for 3-phase inverter of permanent magnet synchronous motor (PMSM) is used in this paper. Simulation results show that the maximum junction temperatures and junction temperature fluctuations of SiC MOSFETs are quite lower than that of Si IGBTs in all test conditions.
  • Keywords
    "Junctions","Insulated gate bipolar transistors","Silicon carbide","MOSFET","Inverters","Silicon","Temperature"
  • Publisher
    ieee
  • Conference_Titel
    Wide Bandgap Power Devices and Applications (WiPDA), 2015 IEEE 3rd Workshop on
  • Type

    conf

  • DOI
    10.1109/WiPDA.2015.7369267
  • Filename
    7369267