Title :
Reliability Tests for Process Flow with Fault Tree Analysis
Author :
Pimthip Paiboonkasemsut;Yachai Limpiyakorn
Author_Institution :
Dept. of Comput. Eng., Chulalongkorn Univ., Bangkok, Thailand
Abstract :
This paper presents a method to automate the generation of test cases from the UML activity diagram representing a process flow. The Fault Tree Diagram (FTD) and the Success Tree Diagram (STD) can be derived from condition-classification tree model. FTD and STD can then be used to facilitate the generation of test cases for functionality and reliability testing by using Fault Tree Analysis method.
Keywords :
"Fault trees","Logic gates","Unified modeling language","Software","Databases","Reliability","Credit cards"
Conference_Titel :
Information Science and Security (ICISS), 2015 2nd International Conference on
DOI :
10.1109/ICISSEC.2015.7371028
