DocumentCode
3723652
Title
High frequency modeling of power MOSFET
Author
Zhijuan Zhang; Yumei Zuo; Chaoyun Deng
Author_Institution
School of Electrical and Electronic Engineering, North China Electric Power University, Baoding, China
fYear
2015
Firstpage
1
Lastpage
4
Abstract
EMI becomes unavoidable owing to the high frequency of power electronics. In order to predict and reduce the influence of EMI, a precise high frequency model of power MOSFET needs to be established to forecast EMI in the circuit. First, two common used power MOSFET models, the sub-circuit model and the lumped-charge model were described. After comparing the advantages and disadvantages of these two models, a novel modeling approach by using Model Architect tools in the saber was introduced. Then by comparing simulation, it was shown that the model built by Model Architect tools can reflect the real situation and is more suitable for the research of conducted EMI.
Keywords
"Semiconductor device modeling","Integrated circuit modeling","MOSFET","Capacitance","Electrodes","Electromagnetic interference","Logic gates"
Publisher
ieee
Conference_Titel
TENCON 2015 - 2015 IEEE Region 10 Conference
ISSN
2159-3442
Print_ISBN
978-1-4799-8639-2
Electronic_ISBN
2159-3450
Type
conf
DOI
10.1109/TENCON.2015.7372894
Filename
7372894
Link To Document