Title :
A 60GHz CMOS transceiver considering HCI reliability
Author_Institution :
Department of Physical Electronics, Tokyo Institute of Technology, Tokyo, Japan, 2-12-1-S3-28, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan
Abstract :
This paper presents a hot-carrier injection (HCI) healing technique with a 60GHz wireless transceiver in 65nm CMOS. The transceiver is capable of 16QAM wireless communication with a data rate of 7Gb/s. The damaged output power can be recovered to 7.8dBm by the proposed HCI-healing technique, and an 81-year lifetime is achieved.
Keywords :
"Human computer interaction","Power amplifiers","CMOS integrated circuits","Transceivers","Power generation","Transistors","Radio frequency"
Conference_Titel :
Radio-Frequency Integration Technology (RFIT), 2015 IEEE International Symposium on
DOI :
10.1109/RFIT.2015.7377874
