Title :
A fast statistical eye-diagram estimation method including internal PDN noise of pseudo-differential receiver buffer
Author :
Heegon Kim;Sumin Choi;Jonghoon J. Kim;Daniel H. Jung;Hyunsuk Lee;Kyungjun Cho;Joungho Kim;Hyungsoo Kim;Yongju Kim;Yunsaing Kim
Author_Institution :
TERA Laboratory, Korea Advanced Institute of Science and Technology, Daejeon, South Korea
Abstract :
In this paper, a fast statistical eye-diagram estimation method including internal PDN noise of pseudo-differential receiver buffer is proposed. For fast BER calculation, the optimal-sized sets of receiver input and internal PDN noise for one unit-interval are employed. They are extracted based on the double-edge responses of the channel and the multiple-edge responses of the pseudo-differential receiver buffer at power/ground nets, respectively. Fast estimation time and accuracy of the proposed method are successfully verified by comparing to the SPICE-based transient simulation results.
Keywords :
"Receivers","Estimation","Channel estimation","Transient analysis","Bit error rate","Crosstalk","Integrated circuit modeling"
Conference_Titel :
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2015 IEEE
DOI :
10.1109/EDAPS.2015.7383679