DocumentCode :
3731718
Title :
Nonlinearity of digital I/Os and its behaviour modeling
Author :
He Ming Yao;Huan Huan Zhang;Hui Chun Yu;Xing Yun Luo;Bin Li;Hua Sheng Ren;Li Jun Jiang
Author_Institution :
Department of Electrical and Electronic Engineering, The University of Hong Kong, Hong Kong
fYear :
2015
Firstpage :
35
Lastpage :
38
Abstract :
Due to the rising signal speed in today´s integrated circuits (ICs), the digital input/output (I/O) device modeling becomes a very serious challenge. However, its nonlinearity issue was even less addressed. But for accurate EMC and EMI characterizations, the I/O nonlinearity could become a source of unexpected EMC and EMI troubles in the high-speed system. In this paper, we analyze the nonlinearity of high-speed drivers and loads under the influence of various parameters, such as the rising and falling times, data and clock duty cycle distortion (DCD), signal skew, balance of the circuit, etc. Further based on the spectrum property of their nonlinear responses, the possible impacts to EMC and EMI are discussed. Both load and driver´s nonlinearity are analyzed. Then using the artificial neural-network (ANN) approaches, the nonlinear behavior of the high-speed digital I/O driver and load are modeled. This work provides a systematic study of the I/O nonlinearity and its behavior modeling process.
Keywords :
"Decision support systems","Packaging","Artificial neural networks","Analytical models","Parametric statistics","Electromagnetic compatibility"
Publisher :
ieee
Conference_Titel :
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2015 IEEE
Type :
conf
DOI :
10.1109/EDAPS.2015.7383702
Filename :
7383702
Link To Document :
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