• DocumentCode
    3734840
  • Title

    Latest advances in silver nanowire based touch module reliability

  • Author

    Andrew Fried; XiaoHui Zhang;Joel Abrahamson; Chao Wang; Jiping Luo;Robert Monson; Po-Sheng Shih; Hsuan-Lin Pan; Tseng-Lung Chang

  • Author_Institution
    Applications Engineering Department, Carestream Advanced Materials, Saint Paul, USA, Shanghai, China
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1186
  • Lastpage
    1189
  • Abstract
    Capacitive touch screens have become an integral component of our everyday lives, from smartphones and tablets to wearable devices, smart-home devices, smart automobiles, entertainment on airplanes, and even in public places such as hotels or shopping malls. As alternative transparent conductive materials to traditional Indium Tin Oxide (ITO) are considered, silver nanowires are among the nanomaterials that offer improved flexibility and performance. However, for wide-scale adoption of these alternative materials in the touch panel marketplace, high manufacturing yields are required, along with performance and reliability in representative environments. This paper summarizes recent work testing capacitive touch modules in rigorous environments, including high temperature at high humidity with bias, high temperature storage, low temperature storage, thermal shock, salt spray (fog), and electrostatic discharge. It is shown that through appropriate selection of design, materials, and process that silver nanowire-based touch screens can pass such environmental challenges and are suitable for use in consumer electronics. An overview of the fabrication process is provided in addition to reliability test methods and results.
  • Keywords
    "Silver","Sensors","Reliability","Integrated circuits","Films","Testing","Humidity"
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO) , 2015 IEEE 15th International Conference on
  • Type

    conf

  • DOI
    10.1109/NANO.2015.7388838
  • Filename
    7388838