DocumentCode
37368
Title
Enabling High-Dimensional Hierarchical Uncertainty Quantification by ANOVA and Tensor-Train Decomposition
Author
Zheng Zhang ; Xiu Yang ; Oseledets, I.V. ; Karniadakis, G.E. ; Daniel, L.
Author_Institution
Res. Lab. of Electron., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume
34
Issue
1
fYear
2015
fDate
Jan. 2015
Firstpage
63
Lastpage
76
Abstract
Hierarchical uncertainty quantification can reduce the computational cost of stochastic circuit simulation by employing spectral methods at different levels. This paper presents an efficient framework to simulate hierarchically some challenging stochastic circuits/systems that include high-dimensional subsystems. Due to the high parameter dimensionality, it is challenging to both extract surrogate models at the low level of the design hierarchy and to handle them in the high-level simulation. In this paper, we develop an efficient analysis of variance-based stochastic circuit/microelectromechanical systems simulator to efficiently extract the surrogate models at the low level. In order to avoid the curse of dimensionality, we employ tensor-train decomposition at the high level to construct the basis functions and Gauss quadrature points. As a demonstration, we verify our algorithm on a stochastic oscillator with four MEMS capacitors and 184 random parameters. This challenging example is efficiently simulated by our simulator at the cost of only 10min in MATLAB on a regular personal computer.
Keywords
circuit simulation; high level synthesis; stochastic processes; ANOVA; Gauss quadrature points; MATLAB; MEMS capacitors; computational cost; high-dimensional hierarchical uncertainty quantification; high-level simulation; personal computer; stochastic circuit simulation; stochastic oscillator; stochastic systems; surrogate models; tensor-train decomposition; variance-based stochastic circuit/microelectromechanical systems simulator; Analysis of variance; Integrated circuit modeling; Micromechanical devices; Polynomials; Stochastic processes; Tensile stress; Testing; Analysis of variance (ANOVA); MEMS simulation; Uncertainty quantification; analysis of variance (ANOVA); circuit simulation; generalized polynomial chaos; generalized polynomial chaos (gPC); hierarchical uncertainty quantification; high dimensionality; microelectromechanical systems (MEMS) simulation; stochastic modeling and simulation; tensor train; uncertainty quantification;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2014.2369505
Filename
6954398
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