DocumentCode
37422
Title
Low Cost Concurrent Error Masking Using Approximate Logic Circuits
Author
Choudhury, Mihir R. ; Mohanram, Kartik
Author_Institution
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
32
Issue
8
fYear
2013
fDate
Aug. 2013
Firstpage
1163
Lastpage
1176
Abstract
With technology scaling, logical errors arising due to single-event upsets and timing errors arising due to dynamic variability effects are increasing in logic circuits. Existing techniques for online resilience to logical and timing errors are limited to detection of errors, and often result in significant performance penalty and high area/power overhead. This paper proposes approximate logic circuits as a design approach for low cost concurrent error masking. An approximate logic circuit predicts the value of the outputs of a given logic circuit for a specified portion of the input space, and can indicate uncertainty about the outputs over the rest of the input space. Using portions of the input space that are most vulnerable to errors as the specified input space, we show that approximate logic circuits can be used to provide low overhead concurrent error masking support for a given logic circuit. We describe efficient algorithms for synthesizing approximate circuits for concurrent error masking of logical and timing errors. Results indicate that concurrent error masking based on approximate logic circuits can mask 88% of targeted logical errors for 34% area overhead and 17% power overhead, 100% timing errors on all timing paths within 10% of the critical path delay for 23% area overhead and 8% power overhead, and 100% timing errors on all timing paths within 20% of the critical path delay for 42% area overhead and 26% power overhead.
Keywords
error detection; logic circuits; logic design; network synthesis; approximate circuit synthesis; approximate logic circuit; concurrent error masking; design approach; error detection; logical error; technology scaling; timing error; Approximation methods; Data structures; Delays; Logic circuits; Logic functions; Concurrent error detection; concurrent error masking; logic synthesis; reliability;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2013.2250581
Filename
6558854
Link To Document