• DocumentCode
    37422
  • Title

    Low Cost Concurrent Error Masking Using Approximate Logic Circuits

  • Author

    Choudhury, Mihir R. ; Mohanram, Kartik

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    32
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    1163
  • Lastpage
    1176
  • Abstract
    With technology scaling, logical errors arising due to single-event upsets and timing errors arising due to dynamic variability effects are increasing in logic circuits. Existing techniques for online resilience to logical and timing errors are limited to detection of errors, and often result in significant performance penalty and high area/power overhead. This paper proposes approximate logic circuits as a design approach for low cost concurrent error masking. An approximate logic circuit predicts the value of the outputs of a given logic circuit for a specified portion of the input space, and can indicate uncertainty about the outputs over the rest of the input space. Using portions of the input space that are most vulnerable to errors as the specified input space, we show that approximate logic circuits can be used to provide low overhead concurrent error masking support for a given logic circuit. We describe efficient algorithms for synthesizing approximate circuits for concurrent error masking of logical and timing errors. Results indicate that concurrent error masking based on approximate logic circuits can mask 88% of targeted logical errors for 34% area overhead and 17% power overhead, 100% timing errors on all timing paths within 10% of the critical path delay for 23% area overhead and 8% power overhead, and 100% timing errors on all timing paths within 20% of the critical path delay for 42% area overhead and 26% power overhead.
  • Keywords
    error detection; logic circuits; logic design; network synthesis; approximate circuit synthesis; approximate logic circuit; concurrent error masking; design approach; error detection; logical error; technology scaling; timing error; Approximation methods; Data structures; Delays; Logic circuits; Logic functions; Concurrent error detection; concurrent error masking; logic synthesis; reliability;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2013.2250581
  • Filename
    6558854