• DocumentCode
    374866
  • Title

    Low-statistics reconstruction with AB-EMML

  • Author

    Erlandsson, K. ; Visvikis, D. ; Waddington, W.A. ; Cullum, I. ; Jarritt, P.H. ; Polowsky, L.S.

  • Author_Institution
    Inst. of Nucl. Med., R. Free & Univ. Coll. Med. Sch., London, UK
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Abstract
    In dynamic SPECT studies with short acquisition times per time-frame, data with very low-statistics is obtained. For such cases standard iterative reconstruction algorithms based on multiplicative correction factors, automatically including a non-negativity constraint, might not be Ideal. The AB-EMML algorithm allows the user to include prior information on the upper and lower bounds for the image values. We have used this algorithm with a negative lower bound for reconstruction of low-statistics SPECT data in order to allow for negative image values. Our results show that this method can preserve quantitative accuracy at low count levels, where standard methods produces biased values. Furthermore, the noise is much more uniformly distributed-lower in high intensity regions and higher in low intensity regions. The convergence is generally slower, but faster in cold regions
  • Keywords
    data acquisition; image reconstruction; iterative methods; maximum likelihood estimation; medical image processing; single photon emission computed tomography; AB-EMML; acquisition times; dynamic SPECT; expectation macimisation maximum likelihood method; lower bounds; multiplicative correction factors; negative image values; non-negativity constraint; standard iterative reconstruction algorithms; upper bounds; Biomedical imaging; Electromagnetic scattering; Image reconstruction; Imaging phantoms; Iterative algorithms; Particle scattering; Positron emission tomography; Reconstruction algorithms; Single photon emission computed tomography; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2000 IEEE
  • Conference_Location
    Lyon
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-6503-8
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2000.950113
  • Filename
    950113