• DocumentCode
    3749486
  • Title

    Electrical degradation and breakdown of mica

  • Author

    I.J. Kemp;W.K. Hogg

  • Author_Institution
    Electrical and Electronic, Engineering Department, Glasgow College of Technology, U.K.
  • fYear
    1983
  • fDate
    7/1/1983 12:00:00 AM
  • Firstpage
    365
  • Lastpage
    369
  • Abstract
    In conclusion, combining the information presented by both experimental programmes, the following points emerge. Given that the results of the discharge investigation can be related to an “intrinsic” mechanism of breakdown, the discharge must produce a highly localised (≈ 10 µm radius) stress site at the mica surface. Moreover, this stress site would require to be sufficiently small to essentially remove the effect of precipitate ionisation in amber phlogopite from the breakdown mechanism. Although the results obtained for amber phlogopite with the 25 [m electrode suggest that some effect, which can be related to the mica structure, is occurring, it is difficult to believe, for the sample thicknesses investigated, that discharge conditions would produce such a consistent breakdown strength if related to the above mechanism.
  • Keywords
    "Breakdown voltage","Discharges (electric)"
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, Proceedings of First International Conference on
  • Type

    conf

  • DOI
    10.1109/ICSD.1983.7411539
  • Filename
    7411539