DocumentCode :
3749920
Title :
High-rate CMP process for large PCB by controlling platen coolant temperature
Author :
Minjong Yuh;Haedo Jeong;Hyoungjae Kim
Author_Institution :
Graduate school of mechanical engineering, Pusan National University, Busan, Republic of Korea
fYear :
2015
Firstpage :
1
Lastpage :
3
Abstract :
In printed-circuit-board (PCB) manufacturing process, Chemical mechanical polishing (CMP) is currently replacing conventional chemical etching or mechanical polishing to remove overburdened copper deposit owing to its ability to realize a global planarization. This paper introduces newly developed Oscar-type CMP machine and copper CMP process to polish rectangular PCB with a size up to 510 mm by 510 mm. The effect of platen coolant temperature on removal rate and removal uniformity during copper CMP is studied to achieve high-rate Cu removal.
Keywords :
"Coolants","Slurries","Size measurement","Probes"
Publisher :
ieee
Conference_Titel :
Planarization/CMP Technology (ICPT), 2015 International Conference on
Type :
conf
Filename :
7412018
Link To Document :
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