A comparison of the near field and far field emissions of a Pentium(R) clock IC

This paper describes a set of measurements made on a clock part accepted for use in computer systems. The data shows that near field measurements of the electric and magnetic fields at the surface of the device correlate with far field measurements made on the system in which the device is used. Through this correlation, it is shown that two bench level measurements can help in isolating potential radiated emissions problems before a system test platform may be available for OATS testing. In addition, by providing emissions detail within the die and package, corrections can be made at this level rather than at the PCB level, thereby providing a low cost alternative to EMI mitigation