DocumentCode
375022
Title
Simulation/experimental analysis of single/differential signals crossing splits
Author
Ilavarasan, Ponniah ; Chen, Juan ; Schaffer, Mike ; Norman, Adam J.
Author_Institution
Intel Corp., Hillsboro, OR, USA
Volume
1
fYear
2001
fDate
2001
Firstpage
667
Abstract
It is known that high-speed single-ended signals crossing a split is not a good practice for EMI and signal integrity (SI) due to interruption of return current. However, it is becoming difficult sometimes to avoid this scenario due to small PCB form factor, i.e., tight routing density. When high-speed traces cross the split, stitching capacitors are placed right next to the crossing point. This paper shows that crossing split increases the overall radiation. In addition, the stitching cap reduces the radiation. However, the effectiveness of the stitching capacitor varies according to implementation. A simulation and experimental analysis is done to show that crossing the spilt is not appropriate for EMI/SI. In a similar manner, an experimental and simulation analysis is done for differential signals to understand the EMI and SI impact when crossing split
Keywords
capacitors; current distribution; electric field measurement; electromagnetic interference; magnetic field measurement; printed circuit design; printed circuit testing; EMI; current distribution; differential signals; high-speed single-ended signals; high-speed traces; radiation increase; radiation. reduction; return current interruption; signal integrity; small PCB form factor; splits crossing; stitching capacitors; tight routing density; Analytical models; Current distribution; Current measurement; Frequency; Magnetic field measurement; Routing; Signal analysis; Signal design; Solids; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location
Montreal, Que.
Print_ISBN
0-7803-6569-0
Type
conf
DOI
10.1109/ISEMC.2001.950726
Filename
950726
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