• DocumentCode
    375022
  • Title

    Simulation/experimental analysis of single/differential signals crossing splits

  • Author

    Ilavarasan, Ponniah ; Chen, Juan ; Schaffer, Mike ; Norman, Adam J.

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    667
  • Abstract
    It is known that high-speed single-ended signals crossing a split is not a good practice for EMI and signal integrity (SI) due to interruption of return current. However, it is becoming difficult sometimes to avoid this scenario due to small PCB form factor, i.e., tight routing density. When high-speed traces cross the split, stitching capacitors are placed right next to the crossing point. This paper shows that crossing split increases the overall radiation. In addition, the stitching cap reduces the radiation. However, the effectiveness of the stitching capacitor varies according to implementation. A simulation and experimental analysis is done to show that crossing the spilt is not appropriate for EMI/SI. In a similar manner, an experimental and simulation analysis is done for differential signals to understand the EMI and SI impact when crossing split
  • Keywords
    capacitors; current distribution; electric field measurement; electromagnetic interference; magnetic field measurement; printed circuit design; printed circuit testing; EMI; current distribution; differential signals; high-speed single-ended signals; high-speed traces; radiation increase; radiation. reduction; return current interruption; signal integrity; small PCB form factor; splits crossing; stitching capacitors; tight routing density; Analytical models; Current distribution; Current measurement; Frequency; Magnetic field measurement; Routing; Signal analysis; Signal design; Solids; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    0-7803-6569-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2001.950726
  • Filename
    950726