DocumentCode
375636
Title
Modular architecture for statistical signal parameter measurement using multi-bit random-data representation
Author
Petriu, Emil M. ; Al-Dhaher, Abdul ; Zhao, Lichen ; Dostaler, Marc
Author_Institution
Sch. of Inf. Technol. & Eng., Ottawa Univ., Ont., Canada
Volume
1
fYear
2001
fDate
2001
Firstpage
295
Abstract
Generalizing von Neumans binary random-pulse machine concept, the paper discusses the multi-bit random-data representation and shows how it can be used for a modular instrumentation architecture for the measurement of first and second order statistical signal parameter measurements
Keywords
VLSI; correlators; covariance analysis; neural chips; quantisation (signal); random functions; VLSI; circuit complexity; modular architecture; multi-bit random-data representation; packing density; pulse stream techniques; statistical signal parameter measurement; von Neumans binary random-pulse machine concept; Arithmetic; DH-HEMTs; Digital signal processing; Information technology; Instruments; Quantization; Random sequences; Signal resolution; Tellurium; Virtual reality;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Computers and signal Processing, 2001. PACRIM. 2001 IEEE Pacific Rim Conference on
Conference_Location
Victoria, BC
Print_ISBN
0-7803-7080-5
Type
conf
DOI
10.1109/PACRIM.2001.953581
Filename
953581
Link To Document