Author_Institution :
NIST, Maryland, United States
Abstract :
It is my pleasure to present the final report of the 2015 IEEE International Integrated Reliability Workshop (IIRW). This report summarizes everything we accomplished this year; everyone involved should be proud of its contents.
Conference_Titel :
Integrated Reliability Workshop (IIRW), 2015 IEEE International
Print_ISBN :
978-1-4673-7395-1
Electronic_ISBN :
2374-8036
DOI :
10.1109/IIRW.2015.7437011
