DocumentCode
376393
Title
Analysis of waveguide architectures of high-power diode lasers by near-field scanning optical microscopy
Author
Lienau, C. ; Guenther, T. ; Malyarchuk, V. ; Tomm, J.W.
Author_Institution
Max-Born-Inst. fur Nichtlineare Optik und Kurzzeitspektroskopie, Berlin, Germany
Volume
1
fYear
2001
fDate
15-19 July 2001
Abstract
A study of laser diodes with different waveguide architectures by means of near-field scanning optical microscopy (NSOM) is presented. Mode profiles of waveguides are directly imaged and a novel contrast mechanism of NSOM is demonstrated.
Keywords
OBIC; laser modes; near-field scanning optical microscopy; photoconductivity; quantum well lasers; waveguide lasers; active quantum-wells; contrast mechanism; defect concentration; direct imaging; emission-mode NSOM; high-power diode lasers; large optical cavity diode lasers; mode profiles; near-field OBIC; near-field scanning optical microscopy; phase information; phase shift; resonant excitation; surface excitation; waveguide architectures; Diode lasers; Fiber lasers; Laser excitation; Light sources; Optical beams; Optical coupling; Optical microscopy; Optical waveguides; Stimulated emission; Waveguide lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location
Chiba, Japan
Print_ISBN
0-7803-6738-3
Type
conf
DOI
10.1109/CLEOPR.2001.970596
Filename
970596
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