• DocumentCode
    3765310
  • Title

    Unsupervised classification of SAR imagery using polarimetric decomposition to preserve scattering characteristics

  • Author

    Ramakalavathi Marapareddy;James V. Aanstoos;Nicolas H. Younan

  • Author_Institution
    Geosystems Research Institute, Mississippi State University, 39762, USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We propose an unsupervised classification method using polarimetric synthetic aperture radar data to detect anomalies on earthen levees. This process mainly involves two stages: 1. Apply the scattering model-based decomposition developed by Freeman and Durden to divide pixels into three scattering categories: surface scattering, volume scattering, and double-bounce scattering. A class initialization scheme is also performed to initially merge clusters from many small clusters in each scattering category by applying a merge criterion developed based on the Wishart distance measure. 2. The iterative Wishart classifier is applied, which is a maximum likelihood classifier based on the complex Wishart distribution. This method not only uses a statistical classification, but also preserves the purity of dominant polarimetric scattering properties, and is superior to the entropy/anisotropy/Wishart classifier. An automated color rendering scheme is applied, based on the classes´ scattering category to code the pixels. The effectiveness of the algorithms is demonstrated using fully quad-polarimetric L-band SAR imagery from the NASA Jet Propulsion Laboratory´s (JPL´s) Uninhabited Aerial Vehicle Synthetic Aperture Radar (UAVSAR). The study area is a section of the lower Mississippi River valley in the southern USA, where earthen flood control levees are maintained by the US Army Corps of Engineers.
  • Keywords
    "Scattering","Synthetic aperture radar","Levee","Image color analysis","Classification algorithms","Remote sensing","NASA"
  • Publisher
    ieee
  • Conference_Titel
    Applied Imagery Pattern Recognition Workshop (AIPR), 2015 IEEE
  • Electronic_ISBN
    2332-5615
  • Type

    conf

  • DOI
    10.1109/AIPR.2015.7444532
  • Filename
    7444532