DocumentCode
3769723
Title
Void free embedment of high voltage electronic modules
Author
Roy Currence
Author_Institution
Marshall Laboratories, Torrance, California
fYear
1968
Firstpage
28
Lastpage
30
Abstract
This paper discusses general embedment techniques applicable to miniaturized, high voltage power supply systems for space applications, such as shown in Figure 1. The need for minimum size, weight, and reliable performance of several years in deep space environment is a severe requirement for the insulation of these systems. It is known that voids (bubbles) in the insulation of high voltage systems can result in sudden partial breakdown of the insulation. Such insulation breakdown, generally referred to as Corona Discharge or Partial Discharge, results from high electric field stress in the insulation.
Keywords
"Liquids","Insulation","Resins","Temperature","Stress","Transistors","Glass"
Publisher
ieee
Conference_Titel
Electrical Insulation Conference, 1968 8th
Print_ISBN
978-1-5090-3107-8
Type
conf
DOI
10.1109/EIC.1968.7456094
Filename
7456094
Link To Document