• DocumentCode
    3769723
  • Title

    Void free embedment of high voltage electronic modules

  • Author

    Roy Currence

  • Author_Institution
    Marshall Laboratories, Torrance, California
  • fYear
    1968
  • Firstpage
    28
  • Lastpage
    30
  • Abstract
    This paper discusses general embedment techniques applicable to miniaturized, high voltage power supply systems for space applications, such as shown in Figure 1. The need for minimum size, weight, and reliable performance of several years in deep space environment is a severe requirement for the insulation of these systems. It is known that voids (bubbles) in the insulation of high voltage systems can result in sudden partial breakdown of the insulation. Such insulation breakdown, generally referred to as Corona Discharge or Partial Discharge, results from high electric field stress in the insulation.
  • Keywords
    "Liquids","Insulation","Resins","Temperature","Stress","Transistors","Glass"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation Conference, 1968 8th
  • Print_ISBN
    978-1-5090-3107-8
  • Type

    conf

  • DOI
    10.1109/EIC.1968.7456094
  • Filename
    7456094