• DocumentCode
    3772663
  • Title

    The anomalous effects in the three-electrode system for dielectric loss measurements

  • Author

    Heng-Kun Xie;Kwan C. Kao;Show-Tien Chen;Song-Zhen Wu

  • Author_Institution
    Materials and Devices Research Laboratory, Department of Electrical Engineering, University of Manitoba, Winnipeg, Manitoba, Canada R3T 2N2
  • fYear
    1983
  • Firstpage
    381
  • Lastpage
    385
  • Abstract
    The physical parameters of the guard gap between the guard and the guarded electrodes of the three electrode system generally used for dielectric loss measurements can be modelled by a simple T-network. Theoretical analysis shows that under certain conditions these parameters can cause great errors or even make the apparent dissipation factor negative, when measured with a Schering bridge. The sharp edges of the guard and the guarded electrodes may result in the creation of high local fields and give rise to electric discharges under high voltage conditions. Local discharges near the sharp edges directly modify the physical parameters of the guard gap. Such anomalous phenomena have been experimentally observed and they can be attributed to the change in physical parameters in the guard gap. Experimental results are in good agreement with the theoretical analysis based on the T-network model.
  • Keywords
    "Electrodes","Bridge circuits","Semiconductor device measurement","Dielectric loss measurement","Surface resistance","Loss measurement"
  • Publisher
    ieee
  • Conference_Titel
    Electrical/Electronical Insulation Conference, 1983 EIC 6th
  • Print_ISBN
    978-1-5090-3114-6
  • Type

    conf

  • DOI
    10.1109/EEIC.1983.7465103
  • Filename
    7465103