Title :
Schottky field emission across narrow gaps and through thin films
Author :
N. M. Bashara;E. T. Doty;D. G. Schueler;L. A. Weitzenkamp
Author_Institution :
Department of Electrical Engineering, University of Nebraska, Lincoln, United States
Abstract :
The Schottky field enhanced emission equation appears to be applicable to a wide variety of structures. It has the following form, equation where A is Richardson´s constant, S the area, φ the work function, d is the separation distance, k is Boltzmann´s constant, T is in degrees Kelvin, ε0 the permittivity constant, V the applied voltage, e the electronic charge and εr is the relative dielectric constant.
Keywords :
"Mathematical model","Films","Glass","Conductivity","Thickness measurement","Gold"
Conference_Titel :
Electrical Insulation, Annual Report 1963 Conference on
Print_ISBN :
978-1-5090-3119-1
DOI :
10.1109/EIC.1963.7466543