DocumentCode :
3775848
Title :
Test-driven migration towards a hardware-abstracted platform
Author :
Wolfgang Raschke;Massimiliano Zilli;Johannes Loinig;Reinhold Weiss;Christian Steger;Christian Kreiner
Author_Institution :
Institute for Technical Informatics, Graz University of Technology, Inffeldgasse 16/1, Graz, Austria
fYear :
2015
Firstpage :
261
Lastpage :
267
Abstract :
Platform-based development is one of the most successful paradigms in software engineering. In embedded systems, the reuse of software on several processor families is often abandoned due to the multitude of compilers, processor architectures and instruction sets. In practice, we experienced that a lack of hardware abstraction leads to non-reusable test cases. We will demonstrate a re-engineering process that follows test-driven development practices which fits perfectly for migration activities. Moreover, we will introduce a process that provides trust for the test cases on a new hardware.
Keywords :
"Java","Hardware","Buffer storage","Software","Smart cards","Memory management","Software engineering"
Publisher :
ieee
Conference_Titel :
Pervasive and Embedded Computing and Communication Systems (PECCS), 2015 International Conference on
Type :
conf
Filename :
7483772
Link To Document :
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