• DocumentCode
    3777792
  • Title

    Simplification of the scheme of the self-tested detector (m, w)-code

  • Author

    N. Butorina

  • Author_Institution
    Tomsk State University, Tomsk, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The article is devoted to the improvements of a self-tested checker (m, n) - codes, constructed within FPGA technology.
  • Keywords
    "Circuit faults","Built-in self-test","Field programmable gate arrays","Single event upsets","Cognition","Computers"
  • Publisher
    ieee
  • Conference_Titel
    East-West Design & Test Symposium (EWDTS), 2015 IEEE
  • Type

    conf

  • DOI
    10.1109/EWDTS.2015.7493137
  • Filename
    7493137
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3777792