DocumentCode
3777809
Title
Quality improvement of analog circuits fault diagnosis based on ANN using clusterization as preprocessing
Author
Sergey Mosin
Author_Institution
Computer engineering department, Vladimir State University (VSU) Vladimir, Russia
fYear
2015
Firstpage
1
Lastpage
4
Abstract
The technique of improvement the fault diagnosis quality of analog circuits using artificial neural network is proposed. The technique is based on combining the methods of clustering and classification the output circuits responses taking into consideration component tolerances at data preparation and training the ANN for solving task of fault diagnosis. The decomposition of technique with description of each step is presented. The results of experimental investigation demonstrating high quality of ANN training for effective fault diagnosis of analog circuits with low probability of ?- and ?-errors are considered.
Keywords
"Circuit faults","Artificial neural networks","Training","Fault diagnosis","Neurons","Analog circuits"
Publisher
ieee
Conference_Titel
East-West Design & Test Symposium (EWDTS), 2015 IEEE
Type
conf
DOI
10.1109/EWDTS.2015.7493158
Filename
7493158
Link To Document