DocumentCode
3777967
Title
Hierarchical built-in test equipment of circuit system based on boundary scan
Author
Wang Nantian; Li Yue; Hu Zheng; Liu Xiubin
Author_Institution
Science and Technology on Integrated Logistics Support Laboratory, National University of Defense Technology, Changsha 410073, China
Volume
1
fYear
2015
fDate
7/1/2015 12:00:00 AM
Firstpage
48
Lastpage
52
Abstract
A hierarchical built-in test equipment of circuit system based on boundary scan, which consists of subsystem-level BITE, board-level BITE and component-level BITE, is presented. Structure and working principle of each level BITE is introduced in detail, after giving the hierarchical structure. Experiment is also carried out to verify the design. The system could combine the strong information obtaining ability in the inferior level BITE and the powerful information processing ability in superior level BITE to enhance the overall test capability of complex circuit system. It can be used for fault diagnosis and isolation of complex hierarchical circuit system in satellite and other spacecraft.
Keywords
"Fault diagnosis","Space vehicles","Data processing","Fault detection","Electrical fault detection","Data acquisition"
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments (ICEMI), 2015 12th IEEE International Conference on
Type
conf
DOI
10.1109/ICEMI.2015.7494187
Filename
7494187
Link To Document