• DocumentCode
    37792
  • Title

    Activity-Driven Fine-Grained Clock Gating and Run Time Power Gating Integration

  • Author

    Li Li ; Ken Choi ; Haiqing Nan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • Volume
    21
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    1540
  • Lastpage
    1544
  • Abstract
    As the two most widely used techniques to reduce dynamic power and leakage power, clock gating (CG) and power gating (PG), respectively, are expected to be integrated together effectively. Normally, the implementation of CG leads to some redundant operations, which provides the opportunity to apply PG. In this brief, we have proposed an activity-driven fine-grained CG and PG integration. First, we introduce an optimized bus-specific-clock-gating (OBSC) scheme to improve traditional XOR-based CG. It chooses only a subset of flip-flops (FFs) to be gated selectively, and the problem of gated FF selection is reduced from exponential complexity into linear. Then those combinational logics, which completely depend on the outputs of gated FFs, are performing redundant operations. They can be power gated, and the clock enable signal generated by OBSC is used as the sleep signal. A minimum average idle time concept is proposed to determine whether the insertion of PG will lead to energy reduction. In order to evaluate our technique, we experimented on twenty ISCAS´89 circuits. The simulation results show that 25.07% dynamic power can be reduced by OBSC, and 50.19% active leakage power can be saved by PG.
  • Keywords
    combinational circuits; flip-flops; logic gates; ISCAS89 circuits; OBSC scheme; activity-driven fine-grained CG-PG integration; activity-driven fine-grained clock gating; clock-enable signal; combinational logics; dynamic power reduction; energy reduction; exponential complexity; flip-flop subset; gated FF selection; leakage power reduction; minimum average idle time concept; optimized bus-specific-clock-gating scheme; run time power gating integration; sleep signal; traditional XOR-based CG; CMOS integrated circuits; Clocks; Estimation; Integrated circuit modeling; Latches; Logic gates; Very large scale integration; Clock gating; low power; power gating;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2012.2212732
  • Filename
    6291802