DocumentCode :
3779649
Title :
Dielectric properties of Teflon from room temperature to 314°C and from frequencies of 102 to 105 c/s
Author :
P. Ehrlich;L. E. Amborski;R. L. Burton
Author_Institution :
National Bureau of Standards, Washington, D. C.
fYear :
1953
Firstpage :
28
Lastpage :
30
Abstract :
Measurements of dielectric constant, dielectric loss and d.c. conductivity of Teflon were made from room temperature to temperatures just below the 327°C first order transition point and from frequencies of 102 to 105 c/s on the high temperature sample holder described in the previous paper. Throughout this entire temperature and frequency range the dissipation factor never exceeds the smallest observable value, i.e., 2 ×10-4 and, consequently, there is no significant frequency dependence of the dielectric constant at any temperature. The d.c. conductivity is always less than its smallest observable value, i.e., 2 × 10-15 mho/cm, throughout this entire temperature range. The dielectric constant is computed to decrease from about 2.02 at 24°C to about 1.84 at 300°C. Its temperature dependence is in approximate agreement with values predicted from the experimental thermal expansion coefficient and the Clausius-Mosotti equation.
Keywords :
"Films","Conductivity","Temperature measurement","Temperature distribution","Dielectrics","Frequency measurement"
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1953. annualReport 1953. Conference on
Print_ISBN :
978-1-5090-3130-6
Type :
conf
DOI :
10.1109/EIC.1953.7508671
Filename :
7508671
Link To Document :
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