DocumentCode :
3781226
Title :
A low-leakage power clamp ESD protection circuit with prolonged ESD discharge time and compact detection network
Author :
Jian Cao;Zhenxu Ye;Yuan Wang;Guangyi Lu;Xing Zhang
Author_Institution :
School of Software and Microelectronics, Peking University, 102600, Beijing, China
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
A novel power-rail ESD clamp circuit with a small time constant to achieve a longer turn-on time is proposed. During an ESD event, the turn-on time of discharge transistor Mbig in the proposed circuit is 5.87 times of that of the traditional one; under the normal power supply condition, the total leakage current has reduced to 4.635% compared with the leakage current of traditional circuit; under fast power supply condition, the proposed power-rail ESD clamp circuit can work efficiently with a turned off discharge transistor, thus avoiding the loss of power consumption due to the false triggering in traditional power-rail ESD clamp circuit.
Keywords :
"Electrostatic discharges","Clamps","Transistors","Power supplies","Discharges (electric)","Leakage currents","Transient analysis"
Publisher :
ieee
Conference_Titel :
ASIC (ASICON), 2015 IEEE 11th International Conference on
Print_ISBN :
978-1-4799-8483-1
Electronic_ISBN :
2162-755X
Type :
conf
DOI :
10.1109/ASICON.2015.7516982
Filename :
7516982
Link To Document :
بازگشت