Title :
Research of reusability based on UVM verification
Author :
Wei Ni;Jichun Zhang
Author_Institution :
Institute of VLSI Design, Hefei University of Technology, Hefei 230009, China
Abstract :
On the basis of analysis of UVM verification methodology, the research focuses on the reusability of UVM verification. The reusability in this paper is reflected in the reuse of verification component, verification platform, test cases and sequences. Firstly, a typical UVM verification platform is studied, then the reusability of UVM platform and test cases are discussed. Finally, a reusable verification platform based on the I2C protocol is designed and the result of verification is analyzed.
Keywords :
"Monitoring","Protocols","Production facilities","Standards","Time-varying systems","Time-domain analysis","Nickel"
Conference_Titel :
ASIC (ASICON), 2015 IEEE 11th International Conference on
Print_ISBN :
978-1-4799-8483-1
Electronic_ISBN :
2162-755X
DOI :
10.1109/ASICON.2015.7517189