DocumentCode
3781968
Title
Some recent studies of random noise between metals and dielectrics
Author
S. I. Reynolds
Author_Institution
General Electric Research Laboratory, Schenectady, N. Y., USA
fYear
1955
Firstpage
55
Lastpage
56
Abstract
The purpose of these studies was to investigate the source of noise which is generated when thin dielectrics are subjected to relatively low D.C. voltages(1,2). If the measured noise voltage is caused by the movement of ions or electrons in the volume of the dielectric between electrodes as shown by Haworth and Bozorth(3), then a semi-quantitative measurement of this noise might be a means whereby prebreakdown avalanches could be studied.
Keywords
"Electrodes","Dielectrics","Dielectric measurement","Films","Noise measurement","Plastics","Voltage measurement"
Publisher
ieee
Conference_Titel
Electrical Insulation, 1955 Conference On
Print_ISBN
978-1-5090-3132-0
Type
conf
DOI
10.1109/EIC.1955.7533338
Filename
7533338
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