Title :
Building a test schedule for automotive microsystems using accelerated testing models
Author :
V.E. Ilian;M. Dragan;M. Bazu;G. Socol
Author_Institution :
Nat. Inst. for Res. & Dev. in Microtechnologies, Bucharest, Romania
fDate :
6/23/1905 12:00:00 AM
Abstract :
A generalized Arrhenius model was used to build a test schedule containing high temperature and high temperature/high humidity stresses applicable to automotive microsystems.
Keywords :
"Automotive engineering","Life estimation","Stress","Databases","Humidity","Temperature","Life testing","Automotive applications","Failure analysis","Acceleration"
Conference_Titel :
Semiconductor Conference, 2001. CAS 2001 Proceedings. International
Print_ISBN :
0-7803-6666-2
DOI :
10.1109/SMICND.2001.967494
