• DocumentCode
    3784255
  • Title

    A memory specific notation for fault modeling

  • Author

    Z. Al-Ars;A.J. Van de Goor;J. Braun;D. Richter

  • Author_Institution
    Fac. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    43
  • Lastpage
    48
  • Abstract
    This paper shows the shortcomings of the current, generic notation for fault models and extends it to allow the description of fault models for DRAMs. The advantage is that the extended fault models can easily be translated into operation sequences and tests that detect the described fault. Examples are given to show that the new notation results in optimized, memory specific, tests that have a shorter run time for a given fault coverage.
  • Keywords
    "Testing","Random access memory","Fault detection","Stress","Read-write memory","SPICE","Information technology","Fault diagnosis","Temperature sensors","Voltage"
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2001. Proceedings. 10th Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-1378-6
  • Type

    conf

  • DOI
    10.1109/ATS.2001.990257
  • Filename
    990257
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3784255