DocumentCode :
3784770
Title :
Steganalysis using image quality metrics
Author :
I. Avcibas;N. Memon;B. Sankur
Author_Institution :
Dept. of Electron. Eng., Uludag Univ., Bursa, Turkey
Volume :
12
Issue :
2
fYear :
2003
Firstpage :
221
Lastpage :
229
Abstract :
We present techniques for steganalysis of images that have been potentially subjected to steganographic algorithms, both within the passive warden and active warden frameworks. Our hypothesis is that steganographic schemes leave statistical evidence that can be exploited for detection with the aid of image quality features and multivariate regression analysis. To this effect image quality metrics have been identified based on the analysis of variance (ANOVA) technique as feature sets to distinguish between cover-images and stego-images. The classifier between cover and stego-images is built using multivariate regression on the selected quality metrics and is trained based on an estimate of the original image. Simulation results with the chosen feature set and well-known watermarking and steganographic techniques indicate that our approach is able with reasonable accuracy to distinguish between cover and stego images.
Keywords :
"Image quality","Steganography","Analysis of variance","Multivariate regression","Image analysis","Watermarking","Cryptography","Information science","Context","Rendering (computer graphics)"
Journal_Title :
IEEE Transactions on Image Processing
Publisher :
ieee
ISSN :
1057-7149
Type :
jour
DOI :
10.1109/TIP.2002.807363
Filename :
1192983
Link To Document :
بازگشت