DocumentCode :
3785494
Title :
ITC 2003 panels: Part 1 [Panel Summaries]
Author :
C. Stolicny
Author_Institution :
Intel
Volume :
21
Issue :
2
fYear :
2004
Firstpage :
160
Lastpage :
163
Keywords :
"Logic testing","System testing","Manufacturing","Instruments","Costs","Fault detection","Computer networks","Computer network reliability","IP networks","Stability"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2004.1277910
Filename :
1277910
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3785494
