3785516

Corrections to “Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices”

R. Thalhammer;G. Wachutka

23

4

2004

581

582

"Laser modes","Semiconductor lasers","Equations","Boundary conditions","Dielectric constant","Typesetting","Error correction","Interpolation","Sorting","Transforms"

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ieee

0278-0070

jour

10.1109/TCAD.2004.825598

1278535