Imaging of surface acoustic waves

Author

Bödefeld, C. ; Beil, F. ; Kutschera, H.-J. ; Streibl, M. ; Wixforth, A.

Author_Institution

Sekt. Phys., Ludwig-Maximilians-Univ., Munchen, Germany

Volume

1

fYear

2001

fDate

2001

Firstpage

145

Abstract

A new method to optically examine surface acoustic wave (SAW) propagation on a semiconductor chip is presented. This visualization method is based on the influence of a SAW on the optical properties of a piezoelectric semiconductor. There are two interaction mechanisms between the SAW and photo generated carriers that allow one to correlate the photoluminescence (PL) to the power of the SAW: First exciton dissociation leads to a reduction of the PL and second trapped charge carriers can be released leading to an enhancement of the PL. In the experiment we use a gated and intensified CCD camera to directly record light coming from the sample. With our setup we are able to display the temporal and spatial distribution of SAW fields with a resolution of 300 ps and 1 μm respectively

Keywords

CCD image sensors; electron traps; excitons; photoluminescence; piezoelectric semiconductors; surface acoustic wave transducers; SAW transducing devices; exciton dissociation; gated CCD camera; intensified CCD camera; interaction mechanisms; photo generated carriers; photoluminescence; piezoelectric semiconductor; semiconductor chip; spatial distribution; surface acoustic waves; temporal distribution; trapped charge carriers; visualization method; Acoustic imaging; Acoustic propagation; Acoustic waves; Lead; Optical imaging; Optical propagation; Optical surface waves; Power generation; Surface acoustic waves; Visualization;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 2001 IEEE

Conference_Location

Atlanta, GA

Print_ISBN

0-7803-7177-1

Type

conf

DOI

10.1109/ULTSYM.2001.991596

Filename

991596