DocumentCode :
3785883
Title :
DAC Highlights
Author :
L. Lavagno
Author_Institution :
Cadence Berkeley Labs and Politecnico di Torino
Volume :
21
Issue :
3
fYear :
2004
Firstpage :
259
Lastpage :
260
Keywords :
"Electronic design automation and methodology","Application specific integrated circuits","Circuit synthesis","Circuit testing","Electrical engineering","Circuit faults","Timing","Moore´s Law","Clocks","Power supplies"
Journal_Title :
IEEE Design & Test of Computers
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2004.7
Filename :
1302092
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3785883
