DocumentCode
378626
Title
QNDT of complicated surface-subsurface defects and imaging of real pitting corrosion by photoacoustic microscopy
Author
Endoh, Haruo ; Hiwatashi, Yoichiro ; Miyamoto, Katsuhiko ; Hoshimiya, Tsutomu
Author_Institution
Tohoku Gakuin Univ., Miyagi, Japan
Volume
1
fYear
2001
fDate
2001
Firstpage
493
Abstract
We performed quantitative nondestructive testing (NDT) of simulated complicated surface-subsurface defects and imaged real pitting corrosion using photoacoustic microscopy. Two types of complicated surface-subsurface defects were fabricated in pure aluminum plate specimens in the first experiment: one was a complicated defect that combined a pinhole surface defect with an internal cylindrical defect; the other was a complicated branched defect that combined a vertical slit-type surface defect with a subsurface defect perpendicular to the surface defect wall. A specimen with an isolated subsurface defect was prepared for comparison. The surface and subsurface parts of the defect were distinguishable in photoacoustic (PA) amplitude and phase images obtained by a PAM. In the second experiment, pitting corrosion was prepared on the surface of aluminum plates in aqueous alcohol solution. PA measurements of real pitting corrosion were carried out and the results were consistent with the results using simulated pitting corrosion
Keywords
aluminium; corrosion; photoacoustic spectra; surface structure; ultrasonic materials testing; Al; PAM; QNDT; aluminum plate; branched defect; complicated defect; imaging; internal cylindrical defect; photoacoustic microscope; photoacoustic microscopy; pinhole surface defect; pitting corrosion; quantitative nondestructive testing; real pitting corrosion; subsurface defects; surface defects; vertical slit-type surface defect; Aluminum; Computational modeling; Corrosion; Ethanol; Methanol; Nondestructive testing; Optical computing; Optical imaging; Optical microscopy; Performance evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2001 IEEE
Conference_Location
Atlanta, GA
Print_ISBN
0-7803-7177-1
Type
conf
DOI
10.1109/ULTSYM.2001.991670
Filename
991670
Link To Document