DocumentCode

3787601

Title

Testing: It´s not just pass/fail anymore

Author

S. Davidson

Author_Institution

Sun Microsystems

Volume

22

Issue

1

fYear

2005

Firstpage

80

Lastpage

80

Keywords

"Testing","Sun"

Journal_Title

IEEE Design & Test of Computers

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.2005.22

Filename

1401830