DocumentCode :
3788044
Title :
Guest Editorial Special Section on Built-In-Test
Author :
R.W. Gao
Volume :
54
Issue :
3
fYear :
2005
Firstpage :
939
Lastpage :
940
Keywords :
"Built-in self-test","Circuit testing","System testing","Circuit faults","Very large scale integration","Software testing","Condition monitoring","Automatic testing","Hardware","Jitter"
Journal_Title :
IEEE Transactions on Instrumentation and Measurement
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2005.850322
Filename :
1433164
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3788044
