• DocumentCode
    3788044
  • Title

    Guest Editorial Special Section on Built-In-Test

  • Author

    R.W. Gao

  • Volume
    54
  • Issue
    3
  • fYear
    2005
  • Firstpage
    939
  • Lastpage
    940
  • Keywords
    "Built-in self-test","Circuit testing","System testing","Circuit faults","Very large scale integration","Software testing","Condition monitoring","Automatic testing","Hardware","Jitter"
  • Journal_Title
    IEEE Transactions on Instrumentation and Measurement
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2005.850322
  • Filename
    1433164
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3788044