DocumentCode :
3788866
Title :
Correction to "Problem in the analysis of semiconductor device materials exposed to ionizing radiation"
Author :
P.F. Schmidt
Author_Institution :
Bell Laboratories, Allentown, Pa.
Volume :
63
Issue :
2
fYear :
1975
Firstpage :
333
Lastpage :
333
Keywords :
"Semiconductor devices","Semiconductor materials","Ionizing radiation","Frequency shift keying","Chirp modulation","Baseband","Amplitude modulation","Noise level","Jitter","Frequency modulation"
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1975.9752
Filename :
1451682
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3788866
