Title :
Outage-based admission region in multi-class cellular systems
Author :
Javidi, Tara ; Teneketzis, Demosthenis
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
We present an approach to defining probability of outage as a system-wide QoS measure for cellular systems. We describe how to use this approach to define an admission region where the requirements on probability of outage are satisfied. We illustrate the approach by constructing the aforementioned admission region for a few examples.
Keywords :
cellular radio; probability; quality of service; admission region; multi-class cellular systems; outage probability; system-wide QoS measure; Bit error rate; Electric variables measurement; Fading; Interference; Land mobile radio cellular systems; Probability; Quality of service; Signal to noise ratio; Telecommunication traffic; Throughput;
Conference_Titel :
Wireless Communications and Networking Conference, 2002. WCNC2002. 2002 IEEE
Print_ISBN :
0-7803-7376-6
DOI :
10.1109/WCNC.2002.993476
