• DocumentCode
    3789705
  • Title

    Design of testable logic circuits

  • Author

    T.W. Williams

  • Author_Institution
    IBM Corporation, Boulder, CO
  • Volume
    74
  • Issue
    3
  • fYear
    1986
  • Firstpage
    525
  • Lastpage
    525
  • Keywords
    "Circuit testing","Logic testing","Logic circuits","Automatic testing","Delay","Logic design","Books","Built-in self-test","Area measurement","Design automation"
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1986.13499
  • Filename
    1457767
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3789705