مرکز منطقه ای اطلاع رساني علوم و فناوري - Corrections to "A quantitative model of the effect of grain size on the resistivity of polycrystalline silicon resistors"

DocumentCode :

3790106

Title :

Corrections to "A quantitative model of the effect of grain size on the resistivity of polycrystalline silicon resistors"

Author :

N.C.C. Lu;L. Gerzberg;J.D. Meindl

Author_Institution :

Stanford University, Stanford, California

Volume :

Issue :

fYear :

1980

Firstpage :

185

Lastpage :

185

Keywords :

"Grain size","Conductivity","Silicon","Resistors","Reproducibility of results","Photovoltaic cells","Coatings"

Journal_Title :

IEEE Electron Device Letters

Publisher :

ieee

ISSN :

0741-3106

Type :

jour

DOI :

10.1109/EDL.1980.25282

Filename :

1481144

Link To Document :