DocumentCode :
3790106
Title :
Corrections to "A quantitative model of the effect of grain size on the resistivity of polycrystalline silicon resistors"
Author :
N.C.C. Lu;L. Gerzberg;J.D. Meindl
Author_Institution :
Stanford University, Stanford, California
Volume :
1
Issue :
9
fYear :
1980
Firstpage :
185
Lastpage :
185
Keywords :
"Grain size","Conductivity","Silicon","Resistors","Reproducibility of results","Photovoltaic cells","Coatings"
Journal_Title :
IEEE Electron Device Letters
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1980.25282
Filename :
1481144
Link To Document :
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