DocumentCode :
3792162
Title :
Electrical stressing effects in commercial power VDMOSFETs
Author :
N. Stojadinovic;I. Manic;V. Davidovic;D. Dankovic;S. Djoric-Veljkovic;S. Golubovic;S. Dimitrijev
Volume :
153
Issue :
3
fYear :
2006
fDate :
6/1/2006 12:00:00 AM
Firstpage :
281
Lastpage :
288
Journal_Title :
IEE Proceedings - Circuits, Devices and Systems
Publisher :
iet
ISSN :
1350-2409
Type :
jour
DOI :
10.1049/ip-cds:20050050
Filename :
1645531
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3792162
